Download An Introduction to Mixed-Signal IC Test and Measurement by Gordon Roberts, Friedrich Taenzler, Mark Burns PDF

By Gordon Roberts, Friedrich Taenzler, Mark Burns

Built-in circuits incorporating either electronic and analog capabilities became more and more usual within the semiconductor undefined. Mixed-signal IC try out and size has grown right into a hugely really expert box of electric engineering. despite the fact that, try out engineering remains to be a comparatively unknown career in comparison to IC layout engineering. It has turn into tougher to rent and educate new engineers to turn into expert mixed-signal try engineers. The sluggish studying curve for mixed-signal try engineers is essentially as a result of scarcity of written fabrics and university-level classes near to mixed-signal trying out. whereas many textbooks were dedicated to the topic of electronic try out and testability, an identical can't be stated for analog and mixed-signal computerized try and measurement.An advent to Mixed-Signal IC try out and dimension is a textbook for complicated undergraduate and graduate-level scholars in addition to engineering pros. It was once written in line with the dearth of uncomplicated direction fabric for mixed-signal attempt and size. The publication assumes an excellent historical past in analog and electronic circuits in addition to a operating wisdom of pcs and machine programming. A historical past in electronic sign processing and statistical research can be precious, even though no longer completely necessary.This textual content encompasses the trying out of either analog and mixed-signal circuits together with many borderline examples. electronic trying out is roofed, yet no longer as greatly end result of the wealth of knowledge in this subject already on hand. Examples and illustrations utilizing state of the art business know-how increase and brighten up the presentation all through. In contemplating the functions of this know-how, the checking out of large-scale mixed-signal circuits and person circuits is brought. The value-added merits of mixed-signal IC checking out to a manufacturer's product are sincerely mentioned, and the position of the try engineer is obviously outlined.

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These features are verified using what is often referredto as a go/no-go test or functional test. Functional tests result in a simple pass/fail result with no numerical reading. Parametric tests, by comparison, are those that return a value that mustbe compared against one or more test limits to determine pass/fail results. The I-s timer is a goodexampleof a circuit that canbe testedwith a functionaltest. It is not necessary to measurethe exact countdownperiod in secondsand fractionsof a second.

Consequently,trace-to-trace capacitances are increased,which may affect sensitivenodesin the circuit. In addition,the Chapter 1 . Overview of Mixed-Signal Testing injection-molded plastic introduces mechanical stressesin the silicon, which may consequently introduceDC voltage shifts. Final testing also guaranteesthat the bond pads are all connected and that the die was not cracked, scratched, or otherwise damaged in the packaging process. After final testing, the devices are ready for shipment to the end-equipment manufacturer.

Once the first silicon wafers arrive, the test engineer begins debuggingthe device, DIB hardware, and software on the ATE tester. Any design problems are reported to the design engineers, who then begin evaluating possible design errors. A second designpass is often required to correct errors and to align the actual circuit performance with specificationrequirements. Finally, the corrected design is releasedto production by the product engineer,who then supports the day-to-day manufacturing of the new product.

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